Geological thin sections and mineral analysis using light microscopy: a comprehensive study

Indexed In

Volume 179 / April 2026

Authors:

GÖKHAN KÜLEKÇİ

Keywords:

Geological Thin Section, Polarizing Microscope, Light Microscopy, Mineral Analysis, Thin Section of Quartz

Abstract:

This study provides valuable insights into mineralogy and geology by detailing the preparation of geological thin sections and the use of light microscopy for mineral analysis. A total of 120 thin sections were prepared from rock samples collected from different regions, following a structured methodology. The analysis focuses on identifying optical properties that is essential for mineral identification, particularly for quartz, whose distinct color and shape characteristics emerge under polarized light. Recognizing these features can be challenging for experts, making the use of computer-assisted analysis as effective alternative. This study highlights the advantages of Leica polarizing microscopes, which enhance accuracy and efficiency compared to traditional methods. The paper also examines key factors that influence the reliability of mineral identification, addressing the time-consuming nature of conventional approaches. By incorporating digital techniques, researchers can obtain faster, more precise, and reproducible results. Ultimately, this study serves as a comprehensive guide for academics and professionals, offering an in-depth comparison of traditional and modern methodologies in geological thin section preparation and mineralogical studies. The findings contribute to improving mineral identification techniques, ensuring greater accuracy in geological research and applications

DOI:

10.19111.bulletinofmre.1702915